Bayesian resolution of the non linear inverse problem of Electrical Impedance Tomography with Finite Element modeling (1997)
Abstract / truncated to 115 words
Resistivity distribution estimation, widely known as Electrical Impedance Tomography (EIT), is a non linear ill-posed inverse problem. However, the partial derivative equation ruling this experiment yields no analytical solution for arbitrary conductivity distribution. Thus, solving the forward problem requires an approximation. The Finite Element Method (FEM) provides us with a computationally cheap forward model which preserves the non linear image-data relation and also reveals sufficiently accurate for the inversion. Within the Bayesian approach, Markovian priors on the log-conductivity distribution are introduced for regularization. The neighborhood system is directly derived from the FEM triangular mesh structure. We first propose a maximum a posteriori (MAP) estimation with a Huber-Markov prior which favours smooth distributions while preserving locally ... toggle 8 keywordselectrical impedance tomography – finite element method – maximum a posteriori – markov random field – conjugate gradient – bilinearity – gibbs sampler – importance sampling
The current layout is optimized for mobile phones. Page previews, thumbnails, and full abstracts will remain hidden until the browser window grows in width.
The current layout is optimized for tablet devices. Page previews and some thumbnails will remain hidden until the browser window grows in width.